Intrinsic and extrinsic residual stresses in multicrystalline silicon thin film solar cells on glass by a novel combined diode laser and solid phase epitaxy process
G. Sarau1, A. Bochmann1, M. Becker1,2 and S. Christiansen1,2
1. Institute of Photonic Technology, Albert-Einstein Str. 9, 07745 Jena, Germany
2. Max-Planck-Institute for Microstructure Physics, Weinberg 2, 06120
Halle, Germany
J. Schneider
CSG Solar AG, Sonnenallee 1-5, D-06766 Thalheim, Germany
SESSION Q7: Thin Film and Amorphous Si
Wednesday Afternoon, December 2, 2009
Chair: Bhushan Sopori
Room 306 (Hynes)
